High-accuracy aspheric x-ray mirror metrology using Software Configurable Optical Test System/deflectometry
暂无分享,去创建一个
[1] Garth J. Williams,et al. Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry. , 2012, Optics express.
[2] J. Greivenkamp. Field Guide to Geometrical Optics , 2004 .
[3] James H. Burge,et al. Optical metrology of a large deformable aspherical mirror using software configurable optical test system , 2014 .
[4] Markus C. Knauer,et al. Phase measuring deflectometry: a new approach to measure specular free-form surfaces , 2004, SPIE Photonics Europe.
[5] T. Ishikawa,et al. Breaking the 10 nm barrier in hard-X-ray focusing , 2010 .
[6] Peter Z. Takacs,et al. Vertical scanning long trace profiler: a tool for metrology of x-ray mirrors , 1997, Optics & Photonics.
[7] Peter Z. Takacs,et al. Design Of A Long Trace Surface Profiler , 1987, Photonics West - Lasers and Applications in Science and Engineering.
[8] James H. Burge,et al. Precision aspheric optics testing with SCOTS: a deflectometry approach , 2013, Optical Metrology.
[9] José Sasián,et al. Introduction to Aberrations in Optical Imaging Systems: Acknowledgements , 2012 .
[10] Mourad Idir,et al. Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach. , 2012, Optics express.
[11] Paul F. Whelan,et al. Which pattern? Biasing aspects of planar calibration patterns and detection methods , 2007, Pattern Recognit. Lett..
[12] James H. Burge,et al. X-ray mirror metrology using SCOTS/deflectometry , 2013, Optics & Photonics - Optical Engineering + Applications.
[13] José Sasián. Introduction to Aberrations in Optical Imaging Systems: Ray aberrations , 2012 .
[14] Chunyu Zhao,et al. Orthonormal vector polynomials in a unit circle, Part I: Basis set derived from gradients of Zernike polynomials. , 2007, Optics express.
[15] Tom L. Zobrist,et al. SCOTS: a reverse Hartmann test with high dynamic range for Giant Magellan Telescope primary mirror segments , 2012, Other Conferences.
[16] V. Mahajan. Aberration Theory Made Simple , 1991 .
[17] James H. Burge,et al. Interferometer Calibration Using the Random Ball Test , 2010 .
[18] D. Malacara-Doblado,et al. Hartmann, Hartmann–Shack, and Other Screen Tests , 2006 .
[19] J. Wyant,et al. Basic Wavefront Aberration Theory for Optical Metrology , 1992 .
[20] Chunyu Zhao,et al. Diffractive optics calibrator: measurement of etching variations for binary computer-generated holograms. , 2014, Applied optics.
[21] K. Kaznatcheev,et al. Current status of the NSLS-II optical metrology laboratory , 2013 .
[22] Frank Siewert,et al. Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8 , 2010 .
[23] Chunyu Zhao,et al. Orthonormal vector polynomials in a unit circle, Part II : Completing the basis set. , 2008, Optics express.
[24] John P. Sutter,et al. Geometrical and wave-optical effects on the performance of a bent-crystal dispersive X-ray spectrometer , 2010 .
[25] W. Southwell. Wave-front estimation from wave-front slope measurements , 1980 .
[26] Run Huang,et al. Measurement of a large deformable aspherical mirror using SCOTS (Software Configurable Optical Test System) , 2013, Optics & Photonics - Optical Engineering + Applications.
[27] Christian Faber,et al. Deflectometry challenges interferometry: the competition gets tougher! , 2012, Other Conferences.
[28] Frank Siewert,et al. The Nanometer Optical Component Measuring Machine , 2008 .
[29] Lirong Wang,et al. Software configurable optical test system: a computerized reverse Hartmann test. , 2010, Applied optics.
[30] James H. Burge,et al. Limits for interferometer calibration using the random ball test , 2009, Optical Engineering + Applications.