Atomic Steps with tuning-fork-based noncontact atomic force microscopy
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[1] Hubert M. Pollock,et al. Interpretation issues in force microscopy , 1991 .
[2] Cleveland,et al. Probing oscillatory hydration potentials using thermal-mechanical noise in an atomic-force microscope. , 1995, Physical review. B, Condensed matter.
[3] K. Karrai,et al. Piezoelectric tip‐sample distance control for near field optical microscopes , 1995 .
[4] Acoustic and dynamic force microscopy with ultrasonic probes , 1996 .
[6] R. Ulbrich,et al. Probe‐surface interaction in near‐field optical microscopy: The nonlinear bending force mechanism , 1996 .
[7] Hal Edwards,et al. Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor , 1997 .
[8] Ronald G. Dixson,et al. Conformal oxides on Si surfaces , 1997 .
[9] N. F. van Hulst,et al. Dynamic behaviour of tuning fork shear-force feedback , 1997 .
[10] Huddee J. Ho. Near-contact mode: a novel AFM operation mode for nondestructive ultrahigh lateral-resolution topography measurement in air , 1998, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.
[11] Din Ping Tsai,et al. Tapping-mode tuning fork force sensing for near-field scanning optical microscopy , 1998 .
[12] W. Rensen,et al. Tuning fork shear-force feedback. , 1998, Ultramicroscopy.
[13] Franz J. Giessibl,et al. HIGH-SPEED FORCE SENSOR FOR FORCE MICROSCOPY AND PROFILOMETRY UTILIZING A QUARTZ TUNING FORK , 1998 .