In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics
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Peter M. Derlet | H. Van Swygenhoven | H. V. Swygenhoven | S. V. Petegem | P. Derlet | Z. Budrovic | A. G. Frøseth | S. Van Petegem | Ž. Budrović | A. Frøseth | H. Swygenhoven
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