On the use of the IC stripline to evaluate the susceptibility to EMI of small integrated circuits

The IC stripline method is one of those suggested in IEC-62132 to evaluate the susceptibility of ICs to radiated electromagnetic interference. In practice, it allows the multiple injection of the interference through the capacitive and inductive coupling of the IC package with the guiding structure (the stripline) in which the device under test is inserted. The pros and cons of this method are discussed and a variant of it is proposed with the aim to address the main problems that arise when evaluating the susceptibility of ICs encapsulated in small packages.

[1]  Franco Fiori,et al.  Measurement of integrated circuit conducted emissions by using a transverse electromagnetic mode (TEM) cell , 2001 .

[2]  SoYoung Kim,et al.  Radiated electromagnetic immunity analysis of VCO using IC stripline method , 2015, 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

[3]  Bart Nauwelaers,et al.  Design and modelling of IC-Stripline having improved VSWR performance , 2011, 2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits.

[4]  Tvrtko Mandic,et al.  IC-Stripline design optimization using response surface methodology , 2013, 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

[5]  Davy Pissoort,et al.  Measuring and simulating EMI on very small components at high frequencies , 2013, 2013 International Symposium on Electromagnetic Compatibility.

[6]  Franco Fiori,et al.  Comparison of IC conducted emission measurement methods , 2003, IEEE Trans. Instrum. Meas..