I/sub DDQ/ test method based on wavelet transformation for noisy current measurement environment

An I/sub DDQ/ test method is proposed in this paper, which is applicable even if supply current measurement is impaired by noise. Wavelet transformation is used for noise elimination in the test method. In this paper, it is shown by some experiments that bridging faults will be detected by using the proposed test method. Since expert knowledge on filter design is not needed in noise elimination of the I/sub DDQ/ test method, it is expected that the test method will be used in many I/sub DDQ/ tests.

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