论文信息 - Partially Self-Checking Circuits and Their Use in Performing Logical Operations

Partially Self-Checking Circuits and Their Use in Performing Logical Operations

A new class of circuits called "partially self-checking circuits" is described. These circuits have one mode of operation called secure mode in which every fault is tested in normal operation and no fault can cause an undetected error. They also have an insecure mode of operation in which undetected errors can occur; however, every fault that can cause an error in insecure mode is tested by some input in secure mode. One application of these circuits is in the arithmetic and logic unit (ALU) of a computer with data encoded in an error-detecting code. While there is no code simpler than duplication which detects single errors in logical operations such as AND and OR, it is shown that there exist partially self-checking networks to perform these operations. A commercially available medium-scale integration (MSI) chip, the 74181 4-bit ALU, can be used in a partially self-checking network to perform arithmetic and logical operations.

John F. Wakerly | J. Wakerly

[1] Algirdas Avizienis,et al. Arithmetic Error Codes: Cost and Effectiveness Studies for Application in Digital System Design , 1971, IEEE Transactions on Computers.

[2] Glen G. Langdon,et al. Concurrent error detection for group look-ahead binary adders , 1970 .

[3] M. Ball,et al. Effects and detection of intermittent failures in digital systems , 1969, AFIPS '69 (Fall).

[4] John Francis Wakerly,et al. Low-cost error detection techniques for small computers. , 1974 .

[5] William C. Carter,et al. Design of dynamically checked computers , 1968, IFIP Congress.

[6] W. W. Peterson,et al. On Codes for Checking Logical Operations , 1959, IBM J. Res. Dev..

[7] William C. Carter,et al. A Simple Self-Testing Decoder Checking Circuit , 1971, IEEE Transactions on Computers.

[8] D. A. Anderson,et al. Design of self-checking digital networks using coding techniques , 1971 .

[9] J. Paul Roth,et al. Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits , 1967, IEEE Trans. Electron. Comput..

[10] Gernot Metze,et al. Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes , 1973, IEEE Transactions on Computers.

[11] Algirdas Avizienis,et al. The STAR (Self-Testing And Repairing) Computer: An Investigation of the Theory and Practice of Fault-Tolerant Computer Design , 1971, IEEE Transactions on Computers.