论文信息 - Characterization of defect traps in SiO2 thin films influence of temperature on defects - 字舞流文

Characterization of defect traps in SiO2 thin films influence of temperature on defects

H. Ikeda | P. Mialhe | J. Charles | A. Sakai | S. Zaima | M. Sakashita | Y. Yasuda | Jean-Yves Rosaye | Norihiko Kurumado | Yurihiko Watanabe