Subphthalocyanine film studied with spectroscopic ellipsometry

A new subphthalocyanine (bromoboron trinitro-subphthalocyanine) thin film was prepared by vacuum deposition on a single-crystal silicon substrate. The ellipsometric spectra of this film were investigated on an improved rotating analyzer-polarizer (RAP) type of scanning ellipsometer. The complex refractive index, dielectric constants, and absorption coefficient of this film in the wavelength range 400 to 700 nm were given. The spectra were explained and discussed.

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