On the generation of small dictionaries for fault location
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[1] Dong Sam Ha,et al. On the Design of High-Yield Reconfigurable PLA's , 1990, IEEE Trans. Computers.
[2] Irith Pomeranz,et al. COMPACTEST: a method to generate compact test sets for combinational circuits , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[3] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[4] W. Kent Fuchs,et al. TWO-STAGE FAULT LOCATION , 1991, 1991, Proceedings. International Test Conference.
[5] Bernard Courtois,et al. COUPLING ELECTRON-BEAM PROBING WITH KNOWLEDGE-BASED FAULT LOCALIZATION , 1991, 1991, Proceedings. International Test Conference.
[6] Irith Pomeranz,et al. On achieving zero aliasing for modeled faults , 1992, [1992] Proceedings The European Conference on Design Automation.
[7] Paul Keating,et al. Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach , 1986, International Test Conference.