论文信息 - Atomic origin of structure in EXAFS experiments

Atomic origin of structure in EXAFS experiments

X-ray absorption edges in solids show extended fine structure up to 30-60 Hartrees (1 or 2 keV) above the edge which is known to be caused by electron scattering from other atoms surrounding the absorbing atom. In addition other structure is sometimes observed, of a slower period, especially nearer to the edge, which are shown to be caused by scattering in the periphery of the absorbing atom. The new structure is closely related to the derivative of the p-phase shift in the case of K-shell excitation, and improved values of the phase shift can be extracted from experiment.

J. Pendry | J. Bordas | R. F. Pettifer | B. Holland

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