Broadband Ferromagnetic Resonance Study of ${\hbox{Co}}_{2}{\hbox{MnSi}}$ Thin Films: Effect of the Film Thickness

The thickness dependence of the static and dynamic properties of Co<sub>2</sub>MnSi (CMS) full Heusler was investigated. Five samples with thickness ranging from 7 to 100 nm were deposited by rf magnetron sputtering on single crystal MgO(001). X-ray diffraction and transmission electron microscopy (TEM) evidence the epitaxial growth of samples, with an epitaxial relationship MgO(001)[100]//CMS(011)[110]. Magnetic properties were studied by standard magnetometry and broadband stripline ferromagnetic resonance (FMR). We observe a four-fold magnetocrystalline anisotropy K<sub>c</sub> = 1.5 × 10<sup>5</sup> erg/cm<sup>3</sup> for thicker samples, and an increase of K<sub>c</sub> up to 2.6 × 10<sup>5</sup> erg/cm<sup>3</sup> for the thinnest sample, accompanied by an increase of saturation magnetization. We attribute this behavior to interfacial effect (strain or stoichiometry).

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