New methodology for localizing faults in programmable and commercial circuits
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[1] Toyokazu Nakamura,et al. LSI fast fault localization by continuously gated fault imaging method , 1994 .
[2] Kiyoshi Nikawa,et al. VLSI Fault Localization Using Electron Beam Voltage Contrast Image -Novel Image Acquisition and Localization Method- , 1992 .
[3] A. Agajanian. Electron Beam Techniques , 1979 .
[4] J.-L. Pelissier,et al. Fully-integrated dynamic fault imaging system for failure analysis and performance enhancement of VLSI , 1989, [1989] Proceedings of the 1st European Test Conference.
[5] Eckhard Wolfgang,et al. Electron beam testing , 1986 .