A history of ion microbeams

[1]  S. Metzger,et al.  Aiming and hit verification in single ion techniques , 1995 .

[2]  R. Schofield,et al.  Applications of ion-beam tomographic element microanalysis (ITEM) , 1995 .

[3]  T. Kamiya,et al.  Submicron microbeam apparatus using a single-ended accelerator with very high voltage stability , 1995 .

[4]  Soo Chin Liew,et al.  PIXE tomographic reconstruction of elemental distributions using an iterative maximum-likelihood method , 1995 .

[5]  H. Bukow,et al.  A superconducting solenoid as probe forming lens for microprobe applications , 1994 .

[6]  M. Takai,et al.  Heavy ion microprobes and their applications , 1993 .

[7]  B. Kirby,et al.  The preparation of biological tissue for a trace element analysis on the proton microprobe , 1993 .

[8]  K. M. Horn,et al.  Ion beam induced charge collection (IBICC) microscopy of ICs: relation to single event upsets (SEU) , 1993 .

[9]  Frank Watt,et al.  A survey of recent PIXE applications in archaeometry and environmental sciences using the Oxford scanning proton microprobe facility , 1993 .

[10]  M. Breese,et al.  Dislocation imaging using transmission ion channeling , 1993 .

[11]  M. Breese,et al.  Microcircuit imaging using an ion‐beam‐induced charge , 1992 .

[12]  I. Nashiyama,et al.  Study of basic mechanisms of single event upset using high-energy microbeams , 1991 .

[13]  M. Takai,et al.  Three-dimensional microanalysis using a focused MeV oxygen ion beam , 1991 .

[14]  S. Namba,et al.  Image processing for three-dimensional analysis by an MeV ion microprobe , 1991 .

[15]  B. Fischer.  Single-particle techniques , 1991 .

[16]  Keith A. Nugent,et al.  Submicron STIM tomography reconstruction techniques , 1991 .

[17]  B. Fischer,et al.  Microtomography by heavy ions , 1990 .

[18]  A. Saint,et al.  Channeling scanning transmission ion microscopy , 1990 .

[19]  D. Angell,et al.  Charge collection ion microscopy: Imaging of defects in semiconductors with a positive ion microbeam , 1989 .

[20]  David N. Jamieson,et al.  The measurement and correction of spherical aberration in a magnetic quadrupole quadruplet lens system , 1988 .

[21]  H. W. Lefevre,et al.  Energy-loss image formation in scanning transmission ion microscopy , 1988 .

[22]  K. Jousten,et al.  Development of a high-brightness gas field-ionization source , 1988 .

[23]  B. Fischer.  The heavy-ion microprobe at GSI — Used for single ion micromechanics , 1988 .

[24]  G. Alton,et al.  High brightness sources for MeV microprobe applications , 1988 .

[25]  D. Jamieson,et al.  Scanning transmission microscopy with a 2 MeV alpha particle microbeam , 1987 .

[26]  Frank Watt,et al.  BEAM OPTICS OF QUADRUPOLE PROBE-FORMING SYSTEMS. , 1984 .

[27]  Akira Ito,et al.  Possible use of proton CT as a means of density normalization in the PIXE semi-microprobe analysis , 1984 .

[28]  K. Short,et al.  Channeling contrast microscopy: Application to semiconductor structures , 1983 .

[29]  J. C. Overley.  Element-Sensitive Computed Tomography with Fast Neutrons , 1983, IEEE Transactions on Nuclear Science.

[30]  F. Martin,et al.  An achromatic quadrupole lens doublet for positive ions , 1982 .

[31]  A. Bos,et al.  A proton microbeam under construction , 1981 .

[32]  L. Grodzins,et al.  Computer calculations of solenoidal focussing of MeV proton beams to one micrometer diameter , 1980 .

[33]  R. Spohr,et al.  Heavy ion microlithography — a new tool to generate and investigate submicroscopic structures , 1980 .

[34]  A. Mazzolini,et al.  Elemental microanalysis of biological and medical specimens with a scanning proton microprobe , 1980 .

[35]  T. R. Fox,et al.  HIGH RESOLUTION SCANNING ION PROBES: APPLICATIONS TO PHYSICS AND BIOLOGY , 1980 .

[36]  G. Legge,et al.  Total quantitative recording of elemental maps and spectra with a scanning microprobe , 1979 .

[37]  J. Cookson,et al.  A secondary electron imaging system for a nuclear microprobe , 1979 .

[38]  M. Suter,et al.  A digitally controlled scanning microprobe for protons and heavy ions , 1978 .

[39]  H. W. Lefevre,et al.  Space charge lens for high current ion beams , 1978 .

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[41]  H. Wilde,et al.  Analysis of the lateral distribution of trace elements in biological and other materials by proton-induced X-ray fluorescence using a microbeam scanner , 1978 .

[42]  W. Augustyniak,et al.  A miniature electrostatic lens for forming MeV millibeams , 1978 .

[43]  B. Povh,et al.  Focussing of proton beams to micrometer dimensions , 1977 .

[44]  B. Povh,et al.  Collimation of ion beams to micrometer dimensions , 1975 .

[45]  P. Hawkes.  Quadrupoles in electron lens design , 1970 .

[46]  T. B. Pierce,et al.  Examination of Surfaces by scanning with Charged Particles , 1966, Nature.

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