A Comprehensive Comparison of EMI Immunity in CMOS Amplifier Topologies

This paper provides the results of a comprehensive comparison between complementary metal oxide semiconductor (CMOS) amplifiers with low susceptibility to electromagnetic interference (EMI). They represent the state-of-the-art in low EMI susceptibility design. An exhaustive scenario for EMI pollution has been considered: the injected interference can indeed directly reach the amplifier pins or can be coupled from the printed circuit board (PCB) ground. This is also a key point for evaluating the susceptibility from EMI coupled to the output pin. All of the amplifiers are re-designed in a United Microelectronics Corporation (UMC) 180 nm CMOS process in order to have a fair comparison. The topologies investigated and compared are basically derived from the Miller and the folded cascode ones, which are well-known and widely used by CMOS analog designers.

[1]  Franco Fiori.  EMI-Induced Distortion of Baseband Signals in Current Feedback Instrumentation Amplifiers , 2018, IEEE Transactions on Electromagnetic Compatibility.

[2]  Maryam Shojaei Baghini,et al.  A highly EMI-immune folded cascode OpAmp in 0.18 μm CMOS technology , 2016, 2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE.

[3]  Sonia Ben Dhia,et al.  Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility , 2006 .

[4]  Jean-Michel Redoute,et al.  Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal , 2016, IEEE Transactions on Reliability.

[5]  Jean-Michel Redouté,et al.  A robust CMOS miller OpAmp with high EMI-immunity , 2017, 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE.

[6]  T.H. Hubing,et al.  The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future , 2009, IEEE Transactions on Electromagnetic Compatibility.

[7]  I. Chahine,et al.  Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz , 2008, IEEE Transactions on Electromagnetic Compatibility.

[8]  Jean-Michel Redouté,et al.  An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS , 2017, IEEE Transactions on Electromagnetic Compatibility.

[9]  Ahmed Amer,et al.  Electromagnetic Interference Resisting Operational Amplifier , 2014, IEEE Transactions on Circuits and Systems I: Regular Papers.

[10]  Jean-Michel Redoute,et al.  Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18 μm CMOS , 2015, Microelectron. Reliab..

[11]  F. Fiori.  Design of an Operational Amplifier Input Stage Immune to EMI , 2007, IEEE Transactions on Electromagnetic Compatibility.

[12]  Michiel Steyaert,et al.  EMI-Resistant CMOS Differential Input Stages , 2010, IEEE Transactions on Circuits and Systems I: Regular Papers.

[13]  G. Masetti,et al.  Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review , 1996 .

[14]  I. Gil,et al.  Characterization and modelling of EMI susceptibility in integrated circuits at high frequency , 2012, International Symposium on Electromagnetic Compatibility - EMC EUROPE.

[15]  Maryam Shojaei Baghini,et al.  Modeling and Design of EMI-Immune OpAmps in 0.18-$\mu$ m CMOS Technology , 2016, IEEE Transactions on Electromagnetic Compatibility.

[16]  Jean-Michel Redouté,et al.  A Generic EMI-Immune Technique for Differential Amplifiers With Single-Ended Output , 2018, IEEE Transactions on Electromagnetic Compatibility.

[17]  Anna Richelli.  EMI Susceptibility Issue in Analog Front-End for Sensor Applications , 2016, J. Sensors.

[18]  Vladimir Ceperic,et al.  Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks , 2009, 2009 20th International Zurich Symposium on Electromagnetic Compatibility.

[19]  L. Colalongo,et al.  Measurements of EMI susceptibility of precision voltage references , 2017, 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo).

[20]  Jean-Michel Redoute,et al.  Increasing the EMI immunity of CMOS operational amplifiers using an on-chip common-mode cancellation circuit , 2014, 2014 International Symposium on Electromagnetic Compatibility.

[21]  Jean-Michel Redoute,et al.  A methodological approach to EMI resistant analog integrated circuit design , 2015, IEEE Electromagnetic Compatibility Magazine.

[22]  Jean-Michel Redoute,et al.  Increased EMI immunity in CMOS operational amplifiers using an integrated common-mode cancellation circuit , 2015, 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC).

[23]  P.S. Crovetti,et al.  Prediction of high-power EMI effects in CMOS operational amplifiers , 2006, IEEE Transactions on Electromagnetic Compatibility.

[24]  Andrea Lavarda,et al.  On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences , 2018, IEEE Transactions on Electromagnetic Compatibility.