A 12b 238kS/s SAR ADC with novel built-in digital calibration method for EEG acquisition applications

A new built-in digital calibration method is proposed in this paper for a split capacitive DAC in SAR ADCs. By using the LSB-side of split CDAC to measure the capacitor mismatch in MSB-side, it saves any auxiliary CDAC for mismatch calibration and also reduces the chip area. In this design, the digital part is implemented by Verilog HDL and synthesized a Global Foundry 0.13 μ m CMOS technology. The simulation results show that with the supply voltage of 0.9V, the ADC consumes 25.4 μW at the sampling rate of 238kS/s. And the SNDR is 68dB with 15.12kHz input sinusoid signal using the proposed calibration method, showing the corresponding figure-of-merit of 52fJ/conv·step.

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