Single-shot, self-calibrated, real-time wavefront sensing in the EUV and Hard X-ray range for source metrology and beamline optimization
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P. Zeitoun | L. Raimondi | M. Idir | X. Levecq | F. Harms | G. Dovillaire | M. Piponnier | F. Harms | O. de la Rochefoucauld | O. de la Rochefoucauld | Martin Piponnier | Xavier Levecq
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