New Insights Into Defect Loss, Slowdown, and Device Lifetime Enhancement
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S. De Gendt | B. Kaczer | Zhigang Ji | Meng Duan | Jian Fu Zhang | Wei Dong Zhang | G. Groeseneken | B. Kaczer | G. Groeseneken | Z. Ji | M. Duan | J. Zhang | S. De Gendt | W. Zhang
[1] Jian Fu Zhang,et al. Energy and Spatial Distributions of Electron Traps Throughout $\hbox{SiO}_{2}/\hbox{Al}_{2}\hbox{O}_{3}$ Stacks as the IPD in Flash Memory Application , 2010, IEEE Transactions on Electron Devices.
[2] T. Ma,et al. Charge trapping in ultrathin hafnium oxide , 2002, IEEE Electron Device Letters.
[3] Guido Groeseneken,et al. Hydrogen induced positive charge generation in gate oxides , 2001 .
[4] B. Kaczer,et al. An Analysis of the NBTI-Induced Threshold Voltage Shift Evaluated by Different Techniques , 2009, IEEE Transactions on Electron Devices.
[5] R. Degraeve,et al. An Assessment of the Location of As-Grown Electron Traps in$hboxHfO_2$/HfSiO Stacks , 2006, IEEE Electron Device Letters.
[6] Tso-Ping Ma,et al. Special Reliability Features for Hf-Based High- Gate Dielectrics , 2005 .
[7] Jian Fu Zhang. Defects and instabilities in Hf-dielectric/SiON stacks (Invited Paper) , 2009 .
[8] B. Kaczer,et al. Real Vth instability of pMOSFETs under practical operation conditions , 2007, 2007 IEEE International Electron Devices Meeting.
[9] M. H. Chang,et al. On positive charge formed under negative bias temperature stress , 2007 .
[10] Negative bias temperature instability on Si-passivated Ge-interface , 2008, 2008 IEEE International Reliability Physics Symposium.
[11] V. Huard. Two independent components modeling for Negative Bias Temperature Instability , 2010, 2010 IEEE International Reliability Physics Symposium.
[12] D. Ang,et al. On the evolution of the recoverable component of the SiON, HfSiON and HfO2 P-MOSFETs under dynamic NBTI , 2011, 2011 International Reliability Physics Symposium.
[13] H.-H. Tseng,et al. Special reliability features for Hf-based high-/spl kappa/ gate dielectrics , 2005, IEEE Transactions on Device and Materials Reliability.
[14] M. Heyns,et al. Process-induced positive charges in Hf-based gate stacks , 2008 .
[15] Guido Groeseneken,et al. Analysis of the kinetics for interface state generation following hole injection , 2003 .
[16] R. Degraeve,et al. Hole-traps in silicon dioxides. Part II. Generation mechanism , 2004, IEEE Transactions on Electron Devices.
[17] B. Kaczer,et al. Recent advances in understanding the bias temperature instability , 2010, 2010 International Electron Devices Meeting.
[18] Muhammad Ashraful Alam,et al. A comprehensive model of PMOS NBTI degradation , 2005, Microelectron. Reliab..
[19] E. Murakami,et al. Modeling of NBTI degradation and its impact on electric field dependence of the lifetime , 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.
[20] Y. Yeo,et al. Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application , 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
[21] H. Reisinger,et al. Consideration of recovery effects during NBTI measurements for accurate lifetime predictions of state-of-the-art pMOSFETs , 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
[22] Jian Fu Zhang,et al. Electron Trapping in HfAlO High-$\kappa$ Stack for Flash Memory Applications: An Origin of $V_{\rm th}$ Window Closure During Cycling Operations , 2011, IEEE Transactions on Electron Devices.
[23] S. De Gendt,et al. Dominant Layer for Stress-Induced Positive Charges in Hf-Based Gate Stacks , 2008, IEEE Electron Device Letters.
[24] G. Groeseneken,et al. BEHAVIOR OF HOT HOLE STRESSED SIO2/SI INTERFACE AT ELEVATED TEMPERATURE , 1998 .
[25] J. Van Houdt,et al. Two-Pulse $C$ – $V$ : A New Method for Characterizing Electron Traps in the Bulk of $ \hbox{SiO}_{2}/\hbox{high-}\kappa$ Dielectric Stacks , 2008 .
[26] Ming-Fu Li,et al. New Insights of BTI Degradation in MOSFETs with SiON Gate Dielectrics , 2009 .
[27] R. Degraeve,et al. Electrical signature of the defect associated with gate oxide breakdown , 2006, IEEE Electron Device Letters.
[28] Zhigang Ji,et al. A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States , 2011, IEEE Transactions on Electron Devices.
[29] B. Kaczer,et al. NBTI Lifetime Prediction and Kinetics at Operation Bias Based on Ultrafast Pulse Measurement , 2010, IEEE Transactions on Electron Devices.
[30] J. F. Zhang,et al. Defect Loss: A New Concept for Reliability of MOSFETs , 2012, IEEE Electron Device Letters.
[31] J. Babcock,et al. Dynamic recovery of negative bias temperature instability in p-type metal–oxide–semiconductor field-effect transistors , 2003 .
[33] M. Heyns,et al. Stress-Induced Positive Charge in Hf-Based Gate Dielectrics: Impact on Device Performance and a Framework for the Defect , 2008, IEEE Transactions on Electron Devices.
[34] T. P. Chen,et al. Nitrogen-enhanced negative bias temperature instability: An insight by experiment and first-principle calculations , 2003 .