Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study
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J. Raskin | D. Schryvers | M. Mitsuhara | S. Turner | T. Pardoen | G. van Tendeloo | H. Idrissi | S. Hata | M. Coulombier | Binjie Wang | Binjie Wang