Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach
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J. A. Paixão | D. Karpinsky | C. Blawert | M. Serdechnova | V. A. Khomchenko | M. Silibin | M. Ivanov
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J. A. Paixão | D. Karpinsky | C. Blawert | M. Serdechnova | V. A. Khomchenko | M. Silibin | M. Ivanov