Analysis and system optimization of a very low frequency high-voltage test system

Abstract: This paper presents a detailed analysis and the optimization of a very low frequency high-voltage test system for cable tests with test voltages up to 200 kVrms. In the analysis, the limitations of the test system due to the initial hardware setup are discussed. An advanced design is proposed based on a parameter optimization, which enlarges the possible operating range and improves the quality of the test voltage. To further increase the operating range, a new setup of the high-voltage test system is proposed following the ideas of a mechatronic system design.