论文信息 - Effect of solder layer crack on the thermal reliability of Insulated Gate Bipolar Transistors - 字舞流文

Effect of solder layer crack on the thermal reliability of Insulated Gate Bipolar Transistors

Ziwei Ouyang | Kexin Wei | Mingxing Du | William Gerard Hurley | W. G. Hurley | Z. Ouyang | Mingxing Du | Kexin Wei | Qiuya Guo | Qiuya Guo

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