Techniques and applications of programmable spectral pattern coding in Texas Instruments DLP spectroscopy

The architecture of a Texas Instruments DLP spectrometer allows techniques of spectrum measurement through programmable patterns previously not possible by conventional spectrometers. Handheld applications or factory settings measuring dynamic product flow may have constraints on sampling methods which vary the amount of illumination entering the spectrometer. Factory monitoring and other in situ applications may have a priori knowledge of expected substances or contaminants and have stringent sampling speed requirements. By defining custom scan patterns and decoding techniques to take advantage of this information, we show that classic time-domain challenges of time-multiplexed sensing systems can be overcome in a DLP spectrometer yielding high performance in challenging applications.