Hardware-based weighted random pattern generation for boundary scan

The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision. Either cellular automata registers (CARs) or linear feedback shift registers (LFSRs) are used as a source of random patterns, and optionally, it is possible to permute and linearly combine random bits from the source to control inputs to the weighting circuit. The authors analyze pattern coverage and conclude with benchmark results on fault coverage differences between CARs and LFSRs.<<ETX>>

[1]  Franc Brglez,et al.  Accelerated Transition Fault Simulation , 1987, 24th ACM/IEEE Design Automation Conference.

[2]  Peter Dirk Hortensius.  Parallel computation of non-deterministic algorithms in vlsi , 1987 .

[3]  Franc Brglez,et al.  Testability-Driven Random Test-Pattern Generation , 1987, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[4]  John A. Waicukauski,et al.  A Method for Generating Weighted Random Test Patterns , 1989, IBM J. Res. Dev..

[5]  Jacob Savir,et al.  Built In Test for VLSI: Pseudorandom Techniques , 1987 .

[6]  Clay S. Gloster,et al.  Boundary scan with cellular-based built-in self-test , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[7]  William Feller,et al.  An Introduction to Probability Theory and Its Applications , 1967 .

[8]  David Bryan,et al.  Automated synthesis for testability , 1989 .

[9]  Sunil Jain,et al.  Statistical Fault Analysis , 1985, IEEE Design & Test of Computers.

[10]  Franc Brglez,et al.  A Fast Fault Grader: Analysis and Applications , 1985, International Test Conference.

[11]  Hans-Joachim Wunderlich,et al.  Multiple distributions for biased random test patterns , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[12]  John A. Waicukauski,et al.  Fault detection effectiveness of weighted random patterns , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[13]  F. Brglez,et al.  Boundary scan with built-in self-test , 1989, IEEE Design & Test of Computers.