Effect of bulk trap density on HfO/sub 2/ reliability and yield
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L. Pantisano | R. Degraeve | G. Groeseneken | A. Kerber | T. Kauerauf | R. Degraeve | E. Cartier | G. Groeseneken | A. Kerber | T. Kauerauf | L. Pantisano | E. Cartier | P. Roussell | P. Roussell
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