Reflection and transmission of focused light beam at a dielectric interface

The reflection and transmission of TE and TM polarized extremely narrow wave beams which are oblique incident on the dielectric interface are analyzed. Disappearance of the Brewster angle and total internal reflection effects for the strongly focused beams is predicted. The change in beam profile after reflection and transmission for different polarizations, incident beam spots and incidence angles is analyzed. Experiments using NSOM (near-field scanning optical probe) fiber probe with an aperture diameter 50 nm are conducted. It is demonstrated that substantial output light intensity increase occurs at the probe end/glass plate interface.

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