Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra
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Robert J. Nemanich | Gerald Lucovsky | D. E. Aspnes | H. Ade | Y. Zou | J. G. Hong | C. C. Fulton | N. A. Stoute | D. G. Schlom | H. Ade | G. Lucovsky | R. Nemanich | D. Aspnes | D. Schlom | J. G. Hong | Y. Zou | C. Fulton | J. G. Hong
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