Predicting URF Upset of MOSFET Digital IC's

Typical input and output stages for a digital integrated circuit (IC) have been simulated using the electronic circuit analysis program SPICE2. An unwanted radio-frequency (URF) signal is injected into the circuit at the point where the output stage is connected to an input stage. The effects of varying the magnitude, the frequency, and the relative phase angle of the URF source are studied. An example of a system-level analysis based on the electronics-level simulations is also given.

[1]  Joseph Tront,et al.  Computer-Aided Analysis of RFI Effects in Operational Amplifiers , 1979, IEEE Transactions on Electromagnetic Compatibility.

[2]  John N Roach The Susceptibility of a 1K NMOS Memory to Conducted Electromagnetic Interference , 1981, 1981 IEEE International Symposium on Electromagnetic Compatibility.

[3]  James Whalen,et al.  Computer-Aided Analysis of RFI Effects in Digital Integrated Circuits , 1979, IEEE Transactions on Electromagnetic Compatibility.

[4]  James R. Armstrong,et al.  GSP: A Logic Simulator for LSI , 1981, 18th Design Automation Conference.