Current rectification effects in 6 nm thick Hf Zr1-Oy ferroelectrics/Si planar heterostructures
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M. Dragoman | D. Dragoman | A. Dinescu | D. Vasilache | M. Modreanu | I. Povey | M. Aldrigo | S. Iordanescu | C. Romanitan | C. Romanițan
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M. Dragoman | D. Dragoman | A. Dinescu | D. Vasilache | M. Modreanu | I. Povey | M. Aldrigo | S. Iordanescu | C. Romanitan | C. Romanițan