A New Reliable Method for Delay-Fault Diagnosis

primary outputs to primary inputs. The proposed method is an alternative to fault simulation. It requires no delay size based fault modeh and considers only the fault-free circuit. consquently, this approach is faster, reliable and requires less memory than conventional fault simulation. The class offaultsknown as delayfauh investigatedin this paper. The Diagnosis process is autOdicallY implemented ajter the detection Of a fault in a circuit. Unfortunately, the existing methodologies for locating timing failures on digital circuits have shown certain deficiencies. A new and reliable method for &lay faulr 2, Detection of a Delay Fault diagnosis, based on the symbolic simulation of the fault-f?ee circuit, is presented.

[1]  Janusz Rajski,et al.  A method of fault analysis for test generation and fault diagnosis , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  John A. Waicukauski,et al.  Fault Diagnosis in an LSSD Environment , 1981, ITC.

[3]  Robert A. Rasmussen,et al.  Delay test generation , 1977, DAC '77.

[4]  Nandakumar Nityananda Tendolkar Analysis of Timing Failures Due to Random AC Defects in VLSI Modules , 1985, DAC 1985.

[5]  S. Koeppe,et al.  Modeling and Simulation of Delay Faults in CMOS Logic Circuits , 1986, International Test Conference.

[6]  Sudhakar M. Reddy,et al.  On the detection of delay faults , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[7]  P. R. Menon,et al.  Critical Path Tracing: An Alternative to Fault Simulation , 1984, IEEE Des. Test.

[8]  Gordon L. Smith,et al.  Model for Delay Faults Based upon Paths , 1985, ITC.

[9]  J.A. Waicukauski,et al.  Failure diagnosis of structured VLSI , 1989, IEEE Design & Test of Computers.

[10]  Michael D. Ciletti,et al.  A Simplified Six-Waveform Type Method for Delay Fault Testing , 1989, 26th ACM/IEEE Design Automation Conference.

[11]  Barry K. Rosen,et al.  Delay test generation. I. Concepts and coverage metrics , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[12]  M. Ray Mercer,et al.  A method of delay fault test generation , 1988, 25th ACM/IEEE, Design Automation Conference.Proceedings 1988..