Tabular data of layer structure factors for clay minerals

In order to obtain either the complete diffraction diagram or the distribution of interlayer distances from the observed diffraction intensities in the calculation of X-ray diffraction effects of interstratified clay minerals a knowledge is required of the structure factor of the layers. This represents the contribution of the layer structure to the variation of scattered amplitude in the [00/] direction in reciprocal space, and is a continuous function for random structures. The layer structure per/~,2 is given by (MacEwan, Ruiz Amil & Brown, 1961): Fz = Z NJ'~ exp(2rcir* Z~) ,