Properties of reactively sputter-deposited TaN thin films

[1]  J. 0. Olowolafe,et al.  Interdiffusions in Cu/reactive‐ion‐sputtered TiN, Cu/chemical‐vapor‐deposited TiN, Cu/TaN, and TaN/Cu/TaN thin‐film structures: Low temperature diffusion analyses , 1992 .

[2]  Karen Holloway,et al.  Tantalum as a diffusion barrier between copper and silicon: Failure mechanism and effect of nitrogen additions , 1992 .

[3]  Wayne A. Anderson,et al.  Stability of tantalum nitride thin film resistors , 1990 .

[4]  S. Murarka,et al.  Tantalum nitride as a diffusion barrier between Pd2Si or CoSi2 and aluminum , 1989 .

[5]  M. Nicolet,et al.  WxN1−x alloys as diffusion barriers between Al and Si , 1988 .

[6]  S. Ashok,et al.  Thermally stable tantalum nitride/silicon Schottky barriers , 1988 .

[7]  B. Mehrotra,et al.  Properties of direct current magnetron reactively sputtered TaN , 1987 .

[8]  S. Kanamori Investigation of reactively sputtered TiN films for diffusion barriers , 1986 .

[9]  Pierre Villars,et al.  Pearson's handbook of crystallographic data for intermetallic phases , 1985 .

[10]  M. Nicolet,et al.  Sputtered W–N diffusion barriers , 1985 .

[11]  R. S. Nowicki,et al.  General aspects of barrier layers for very-large-scale integration applications II: Practice , 1982 .

[12]  M. Wittmer Interfacial reactions between aluminum and transition‐metal nitride and carbide films , 1982 .

[13]  M. Wittmer High-temperature contact structures for silicon semiconductor devices , 1980 .

[14]  M.-A. Nicolet,et al.  Diffusion barriers in thin films , 1978 .

[15]  W. Westwood,et al.  Tantalum thin films , 1975 .

[16]  K. Hieber Structural and electrical properties of Ta and Ta nitrides deposited by chemical vapour deposition , 1974 .

[17]  L. Toth Transition Metal Carbides and Nitrides , 1971 .

[18]  P. Hall,et al.  Superconducting Thin Films of Niobium, Tantalum, Tantalum Nitride, Tantalum Carbide, and Niobium Nitride , 1964 .

[19]  D. Gerstenberg,et al.  Effects of Nitrogen, Methane, and Oxygen on Structure and Electrical Properties of Thin Tantalum Films , 1964 .