MPS(3N) transparent memory test for Pattern Sensitive Fault detection
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[1] Kewal K. Saluja,et al. Testing reconfigured RAM's and scrambled address RAM's for pattern sensitive faults , 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[2] John P. Hayes,et al. Detection oF Pattern-Sensitive Faults in Random-Access Memories , 1975, IEEE Transactions on Computers.
[3] Bruce F. Cockburn. Deterministic tests for detecting scrambled pattern-sensitive faults in RAMs , 1995, Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing.
[4] Michael Nicolaidis,et al. Theory of Transparent BIST for RAMs , 1996, IEEE Trans. Computers.
[5] Vyacheslav N. Yarmolik,et al. March PS(23N) test for DRAM pattern-sensitive faults , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
[6] A. J. van de Goor,et al. Testing Semiconductor Memories: Theory and Practice , 1998 .