论文信息 - IR Lock-In Thermography Analysis to Evidence Dynamic Mis-Behavior of SiC Device Prototypes - 字舞流文

IR Lock-In Thermography Analysis to Evidence Dynamic Mis-Behavior of SiC Device Prototypes

P. Godignon | X. Jordà | D. Tournier | J. Leon | X. Perpiñà | J. Montserrat | F. Chevalier