DESIGN OF FAILURE-CENSORED ACCELERATED LIFE-TEST SAMPLING PLANS FOR LOGNORMAL AND WEIBULL DISTRIBUTIONS

This paper considers the design of life-test sampling plans based on failure-censored accelerated life tests for products with lognormal and Weibull lifetime distributions. Two levels of stress higher than the use condition stress, high and low, are used. The sample size, sample proportion allocated to each stress level, and the lot acceptability constant which satisfy the producer's risk and consumer's risk and minimize the generalized asymptotic variance of the maximum likelihood estimators of the model parameters are obtained. The properties of the proposed sampling plans are investigated.

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