March AB, March AB1: new March tests for unlinked dynamic memory faults

Among the different types of algorithms proposed to test static random access memories (SRAMs), March tests have proven to be faster, simpler and regularly structured. New memory production technologies introduce new classes of faults usually referred to as dynamic memory faults. A few March tests for dynamic fault, with different fault coverage, have been published. In this paper, we propose new March tests targeting unlinked dynamic faults with lower complexity than published ones. Comparison results show that the proposed March tests provide the same fault coverage of the known ones, but they reduce the test complexity, and therefore the test time

[1]  Alfredo Benso,et al.  Automatic March tests generation for static and dynamic faults in SRAMs , 2005, European Test Symposium (ETS'05).

[2]  Carlos R. P. Hartmann,et al.  An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories , 1977, IEEE Transactions on Computers.

[3]  Sudhakar M. Reddy,et al.  A March Test for Functional Faults in Semiconductor Random Access Memories , 1981, IEEE Transactions on Computers.

[4]  Zaid Al-Ars,et al.  Functional memory faults: a formal notation and a taxonomy , 2000, Proceedings 18th IEEE VLSI Test Symposium.

[5]  Ad J. van de Goor,et al.  Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs , 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

[6]  A. J. van de Goor,et al.  Testing Semiconductor Memories: Theory and Practice , 1998 .

[7]  Alfredo Benso,et al.  Specification and design of a new memory fault simulator , 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..

[8]  Said Hamdioui,et al.  March SS: a test for all static simple RAM faults , 2002, Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).

[9]  Arnaud Virazel,et al.  Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution , 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..

[10]  Said Hamdioui,et al.  Testing static and dynamic faults in random access memories , 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

[11]  J. Otterstedt,et al.  Integration of non-classical faults in standard March tests , 1998, Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236).

[12]  Marian Marinescu,et al.  Simple and Efficient Algorithms for Functional RAM Testing , 1982, ITC.

[13]  Ad J. van de Goor,et al.  Approximating infinite dynamic behavior for DRAM cell defects , 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

[14]  Ad J. van de Goor,et al.  Using March Tests to Test SRAMs , 1993, IEEE Des. Test Comput..

[15]  Ravindra Nair.  Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories" , 1979, IEEE Trans. Computers.

[16]  Frans P. M. Beenker,et al.  A realistic fault model and test algorithms for static random access memories , 1990, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[17]  Said Hamdioui,et al.  Importance of dynamic faults for new SRAM technologies , 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..