论文信息 - A review of failure modes and mechanisms of GaN-based HEMTs - 字舞流文

A review of failure modes and mechanisms of GaN-based HEMTs

Failure modes and mechanisms of AlGaN/GaN HEMTs, observed during accelerated tests at various bias conditions are reviewed.

G. Meneghesso | M. Meneghini | A. Tazzoli | E. Zanoni | F. Zanon | G. Verzellesi | F. Danesin | F. Rampazzo | G. Verzellesi | M. Meneghini | G. Meneghesso | F. Rampazzo | E. Zanoni | F. Zanon | F. Danesin | A. Tazzoli

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