Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry

A holographic arrangement using two holograms symmetrically placed to the perpendicular of the component under investigation will be introduced. By means of a simple difference method using an image processing system, the relative in-plane-displacement and corresponding strain in a defined direction can be determined. The effects of other directional movements (e.g. tilting) will be fully compensated.