Direct visualization of the N impurity state in dilute GaNAs using scanning tunneling microscopy.

The interaction between nitrogen (N) impurity states in III-V compounds plays a key role in controlling optoelectronic properties of the host materials. Here, we use scanning tunneling microscopy to characterize the spatial distribution and electronic properties of N impurity states in dilute GaNAs. We demonstrated that the N impurity states can be directly visualized by taking empty state current images using the multipass scanning method. The N impurity states broadened over several nanometers and exhibited a highly anisotropic distribution with a bowtie-like shape on the GaAs(110) surface, which can be explained by anisotropic propagation of strain along the zigzag chains of Ga and As atoms in the {110} plane. Our experimental findings provide strong insights into a possible role of N impurity states in modifying properties of the host materials.

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