The importance of EBIT data for Z-pinch plasma diagnostics
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S. Hansen | P. Beiersdorfer | V. Kantsyrev | A. Safronova | N. Ouart | U. Safronova | K. Williamson | G. Osborne | M. Yilmaz | P. Neill | D. Fedin | I. Shrestha | T. Hoppe | C. Harris