论文信息 - Analog testability analysis and fault diagnosis using behavioral modeling

Analog testability analysis and fault diagnosis using behavioral modeling

This paper presents an efficient strategy for testability analysis and fault diagnosis of analog circuits using behavioral models. A key contribution is a new algorithm for determining analog testability. Experimentally, we determined the testability and faults of a fabricated 10 bit digital-to-analog converter modeled using the analog hardware description language, Cadence-AHDL. Also, we applied the testability analysis at the circuit level using SPICE sensitivity analysis.<<ETX>>

E. Felt | A. Sangiovanni-Vincentelli | E. Liu | W. Kao

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