Statistical Compact Modeling and Si Verification Methodology

As we scale down to sub-65nm technologies, transistors and interconnects no longer act as predictable elements, but start acting as statistical blocks due to static and dynamic variations. This invited paper first reviews some of the key variations that need to be considered for any statistical analysis. Also, details for implementing statistical models into compact modeling flow are discussed. Finally, the paper reviews one of the techniques used for generating and validating statistical models with the silicon data

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