Use of structural tests in RTL verification

Functional verification is a major hurdle in todaypsilas design flow. Current technologies are not meeting the challenges imposed by design complexity. Dark corners detection is still the simulation bottleneck in the verification process. While functional verification remains not sufficiently mature, test techniques are improved and completely automated, accordingly complex circuits can be tested in few seconds and hard faults can be covered with no effort. In this paper, we establish the relationship existing between dark corners and hard faults. Based on this relation, we explore the use of structural test patterns in the verification process and compare the results to well-known verification techniques.

[1]  Chantal Robach,et al.  From specification validation to hardware testing: a unified method , 1996, Proceedings International Test Conference 1996. Test and Design Validity.

[2]  Jian Kang,et al.  Efficient RTL Coverage Metric for Functional Test Selection , 2007, 25th IEEE VLSI Test Symposium (VTS'07).

[3]  Xiao Sun,et al.  Functional verification coverage vs. physical stuck-at fault coverage , 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

[4]  Testability Analysis.  An Approach to Functional Level , 1989 .

[5]  William K. Lam.  Hardware Design Verification: Simulation and Formal Method-Based Approaches (Prentice Hall Modern Semiconductor Design Series) , 2005 .

[6]  Srinivas Patil,et al.  Scan-based transition test , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[7]  Vishwani D. Agrawal,et al.  Validation vector grade (VVG): a new coverage metric for validation and test , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

[8]  F. Joel Ferguson,et al.  Testing finite state machines based on a structural coverage metric , 2002, Proceedings. International Test Conference.

[9]  Premachandran R. Menon,et al.  An approach to functional level testability analysis , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.