论文信息 - Multi-station electron scrubbing and performance testing device of large-area MCP

Multi-station electron scrubbing and performance testing device of large-area MCP

Microchannel Plates(MCP) have been widely used in X-ray detection, night vision and other fields. X-ray detection used in the field of space usually requires a lot of large area of MCPs. A set of multi-station electron scrubbing and performance testing device for large area MCP is developed in this paper. Four sets of large area electron source are designed for electron scrubbing. Aiming at single MCP and dual-MCP structure, the high voltage power system, signal processing module and mechanical control structure are designed to achieve scrubbing and testing of 4 groups of large area MCP at the same time. By using this device, the scrubbing and testing of large area MCPs of 106mm in diameter are achieved. The test results are given and analyzed.

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