Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations
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Giancarlo Bartolucci | Romolo Marcelli | Benno Margesin | Emanuela Proietti | Andrea Lucibello | Viviana Mulloni | E. Proietti | B. Margesin | R. Marcelli | G. Bartolucci | V. Mulloni | A. Lucibello
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