Cost-Optimized Burn-In Duration forRepairable Electronic Systems

ofcost-optimized burn-in andevaluating theresultant saving forrepair- t able electronics systems. Infant mortality failures occur according toa tb* optimum burn-in time nonhomogeneous Poisson Process; repair actions restore thesystem toa p(t) peril rate (rate ofoccurrence offailure) bad-as-old condition. Thes-expected costs associated withfactory and m(t) meanvalue function foraPoisson process; s-expected fi'eld failures aretraded-off with thecosts ofimplementing abum-in number offalures in(0,t) program. Under theconstraints ofthemodel, theoptimum bum-in Qtb)s-expected value ofcostofoperating aunit, given tb duration andconsequent cost saving areindependent oftheeventualC(t+)s-t e d evaluaed o oto0au 0. life ofthesystem inthefield. Anumerical example illustrates these b) evaluated attb 1 concepts. Nb numberoffailures occurring during burn-in, r.v. Nd number offailures occurring during deployment, r.v.