Single Output Distributed Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures

This paper proposes a distributed two-rail checker architecture which is specifically targeted to self-checking bus-based systems. The architecture makes use of a single bus line to provide error indication. With respect to conventional two-rail checkers additional diagnosing capabilities are provided. The checker is totally-self-checking with respect to stuck-at faults. It features also good self-testing properties with respect to parametric faults, such as bridgings and delay faults.

[1]  Andrzej J. Strojwas,et al.  A Unified Approach for Timing Verification and Delay Fault Testing , 1997 .

[2]  P. K. Lala.  Self-Checking and Fault-Tolerant Digital Design , 1995 .

[3]  Cecilia Metra,et al.  Compact and highly testable error indicator for self-checking circuits , 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

[4]  Yervant Zorian,et al.  On-Line Testing for VLSI—A Compendium of Approaches , 1998, J. Electron. Test..

[5]  R. Rodríguez-Montañés,et al.  Bridging defects resistance in the metal layer of a CMOS process , 1996, J. Electron. Test..

[6]  Cecilia Metra,et al.  Highly testable and compact single output comparator , 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

[7]  Dhiraj K. Pradhan,et al.  Fault-tolerant computing : theory and techniques , 1986 .

[8]  Gernot Metze,et al.  Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes , 1973, IEEE Transactions on Computers.

[9]  Cecilia Metra,et al.  Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines , 2000, IEEE Trans. Computers.

[10]  Michael Gössel,et al.  Self-Checking Comparator with One Periodic Output , 1996, IEEE Trans. Computers.

[11]  B. Ricco,et al.  On-line testing and diagnosis scheme for intermediate voltage values affecting bus lines , 2000, Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637).

[12]  Bernard Courtois,et al.  Strongly Code Disjoint Checkers , 1988, IEEE Trans. Computers.