IR microscopy with a transient photo-induced near-field probe (tipless near-field microscopy)

Photo-induced reflectivity generated by picosecond pulses of light incident on the surface of semiconductors has been used to create transient mirrors with dimensions determined by the spot size of the visible light. These mirrors were used as near-field probes for scattering of the infrared (IR) laser beam. It has been verified that the IR light reflected from this transient mirror has a spatial resolution determined by the spot size of the visible light. This methodology enables IR microscopy of thin samples with the resolution of a visible microscope. Advantages of this approach are: (i) no need for near-field distance control, (ii) possibility of fast sample scanning, (iii) no attenuation of the IR beam in a tapered fiber probe, and (iv) the sample to be imaged can be covered by or encased in a transparent liquid or solid. Preliminary results, prospects and limitations are discussed.

[1]  Y. Martin,et al.  Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution , 1995, Science.

[2]  Alfred J. Meixner,et al.  Temperature profile of fiber tips used in scanning near‐field optical microscopy , 1996 .

[3]  Robert J. Chichester,et al.  Single Molecules Observed by Near-Field Scanning Optical Microscopy , 1993, Science.

[4]  Lukas Novotny,et al.  Radiation coupling and image formation in scanning near-field optical microscopy , 1996 .

[5]  D. Zeisel,et al.  Pulsed laser‐induced desorption and optical imaging on a nanometer scale with scanning near‐field microscopy using chemically etched fiber tips , 1996 .

[6]  A. Lewis,et al.  New design and imaging concepts in NSOM , 1995 .

[7]  N. Bloembergen,et al.  Picosecond time‐resolved reflectivity and transmission at 1.9 and 2.8 μm of laser‐generated plasmas in silicon and germanium , 1984 .

[8]  D. Pohl,et al.  Scanning near-field optical probe with ultrasmall spot size. , 1995, Optics letters.

[9]  Naresh Chand,et al.  Near‐field optical spectroscopy of single quantum wires , 1996 .

[10]  J. J. Macklin,et al.  Time-resolved spectroscopy of single molecules using near-field and far-field optics , 1996 .

[11]  H. Alan Schwettman,et al.  Pulse stacking in the SCA/FEL external cavity , 1997 .

[12]  A. Boccara,et al.  Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of lambda/600. , 1996, Optics letters.

[13]  Patrick J. Moyer,et al.  Near-Field Optics: Theory, Instrumentation, and Applications , 1996 .

[14]  K. Birkelund,et al.  Optical near‐field lithography on hydrogen‐passivated silicon surfaces , 1996 .