Planetary X-ray fluorescence analogue laboratory experiments and an elemental abundance algorithm for C1XS

Abstract We have conducted laboratory experiments as an analogue to planetary XRF (X-ray fluorescence) missions in order to investigate the role of changing incidence (and phase) angle geometry and sample grain-size on the intensity of XRF from regolith-like samples. Our data provide evidence of a grain-size effect, where XRF line intensity decreases with increasing sample grain-size, as well as an almost ubiquitous increase in XRF line intensity above incidence angles of ∼60°. Data from a lunar regolith simulant are also used to test the accuracy of an XRF abundance algorithm developed at the Rutherford Appleton Laboratory (RAL), which is used to estimate the major element abundance of the lunar surface from Chandrayaan-1 X-ray Spectrometer (C1XS) XRF data. In ideal situations (i.e., when the input spectrum is well defined and the XRF spectrum has a sufficient signal to noise ratio) the algorithm can recover a known rock composition to within 1.0 elemental wt% (1 σ ).

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