Focusing light with a reflection photon sieve.

An advanced type of diffractive optical element is presented that combines the concept of the photon sieve with an off-axis, off-normal incidence reflection geometry. Compared to transmission optical elements, the signal-to-background ratio is significantly increased by separating the first from other diffraction orders without drastically reducing the size of the smallest diffractive element. The reflection photon sieve produces sharp foci at maximum contrast and offers the advantages of effective heat dissipation and a large working space above the focal plane. Experimental results for a device working at a photon energy of 100 eV are presented and compared to theory.

[1]  T. Wilhein,et al.  A special method to create gratings of variable line density by low voltage electron beam lithography , 1996 .

[2]  Weilun Chao,et al.  Demonstration of 12 nm resolution Fresnel zone plate lens based soft x-ray microscopy. , 2009, Optics express.

[3]  J. F. van der Veen,et al.  Focusing x-ray beams to nanometer dimensions. , 2003, Physical review letters.

[4]  H. C. Kang,et al.  Nanometer linear focusing of hard x rays by a multilayer Laue lens. , 2006, Physical review letters.

[5]  T. Salditt,et al.  Waveguide-based off-axis holography with hard X rays. , 2006, Physical review letters.

[6]  T. Wilhein,et al.  X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plate , 1998 .

[7]  B. Lengeler,et al.  Focusing hard x rays to nanometer dimensions by adiabatically focusing lenses. , 2005, Physical review letters.

[8]  T. Wilhein,et al.  Off-axis reflection zone plate for quantitative soft x-ray source characterization , 1997 .

[9]  A. Sakdinawat,et al.  Nanoscale X-ray imaging , 2009 .

[10]  R. L. Johnson,et al.  Sharper images by focusing soft X-rays with photon sieves , 2001, Nature.

[11]  B. Niemann,et al.  A rotating condenser and off-axis zone plate monochromator for the TXM at the undulator U41 at BESSY II , 2001 .

[12]  E. Anderson,et al.  Soft X-ray microscopy at a spatial resolution better than 15 nm , 2005, Nature.

[13]  F. Pfeiffer,et al.  Nanometer focusing properties of Fresnel zone plates described by dynamical diffraction theory , 2006 .

[14]  E. Fabrizio,et al.  Synchrotron Radiation Scanning Photoemission Microscopy: Instrumentation And Application In Surface Science , 1999 .

[15]  Jörg Raabe,et al.  Advanced thin film technology for ultrahigh resolution X-ray microscopy. , 2009, Ultramicroscopy.

[16]  A. Michette,et al.  Nanometer focusing of X-rays with modified reflection zone plates , 2005 .

[17]  D. Attwood.  Soft X-Rays and Extreme Ultraviolet Radiation , 1999 .