New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs

A new on-chip oscillation test strategy for analog and mixed-signal circuits is presented. In the proposed method, onchip Schmitt trigger is used as the on-chip frequency reference to compensate the influence of process parameter variations. Furthermore, this solution also brings the possibility to implement Oscillation-based Built-In Self-Test (OBIST) for analog and mixed-signal integrated circuits. The proposed OBIST strategy has been experimentally applied to active analog integrated filters, and its efficiency in detecting hard-detectable catastrophic faults is presented. To demonstrate applicability of the proposed method also in nanoscale technologies, the method has been used to test a noninverting amplifier designed in 90 nm CMOS technology. Consequently, the impact of scaling was analyzed and the method efficiency in covering catastrophic faults achieved for 0.35 μm and 90 nm CMOS technology were compared.

[1]  Mansour H. Assaf,et al.  Testing Analog and Mixed-Signal Circuits with Built-In Hardware - A New Approach , 2005, IMTC 2005.

[2]  Serge N. Demidenko,et al.  Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests , 2011, IEEE Transactions on Instrumentation and Measurement.

[3]  R. Jacob Baker,et al.  CMOS Circuit Design, Layout, and Simulation , 1997 .

[4]  Gloria Huertas,et al.  Practical Oscillation-Based Test of Integrated Filters , 2002, IEEE Des. Test Comput..

[5]  Bozena Kaminska,et al.  Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits , 1997, Proceedings International Test Conference 1997.

[6]  José Luis Huertas,et al.  New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters , 2001, J. Electron. Test..

[7]  Tsin-Yuan Chang,et al.  An embedded built-in-self-test approach for digital-to-analog converters , 2001, Proceedings 10th Asian Test Symposium.

[8]  Gloria Huertas,et al.  On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits , 2002 .

[9]  Gloria Huertas Sanchez,et al.  Oscillation-Based Test in Mixed-Signal Circuits (Frontiers in Electronic Testing) , 2006 .

[10]  Chien-In Henry Chen,et al.  Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters , 2007, IEEE Transactions on Instrumentation and Measurement.

[11]  Gloria Huertas,et al.  Practical solutions for the application of the oscillation-based-test: start-up and on-chip evaluation , 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

[12]  Uros Kac,et al.  Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration , 2007, J. Electron. Test..

[13]  K. Arabi,et al.  Design for testability of embedded integrated operational amplifiers , 1998, IEEE J. Solid State Circuits.

[14]  G. Huertas,et al.  Effective oscillation-based test for application to a DTMF filter bank , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[15]  Karim Arabi,et al.  Mixed Signal DFT: A Concise Overview , 2003, ICCAD.

[16]  Ada Fort,et al.  Automated selection of test frequencies for fault diagnosis in analog electronic circuits , 2005, IEEE Transactions on Instrumentation and Measurement.

[17]  Vanco B. Litovski,et al.  Oscillation based analog testing — A case study , 2011, 2011 Proceedings of the 34th International Convention MIPRO.

[18]  Miquel Roca,et al.  Oscillation-Test Technique for CMOS Operational Amplifiers by Monitoring Supply Current , 2002 .

[19]  Daniel Arbet,et al.  Increasing the efficiency of analog OBIST using on-chip compensation of technology variations , 2011, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.

[20]  Gloria Huertas,et al.  Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell , 2002, IEEE Des. Test Comput..

[21]  Karim Arabi,et al.  Oscillation-test methodology for low-cost testing of active analog filters , 1999, IEEE Trans. Instrum. Meas..

[22]  Sergio Callegari,et al.  Complex Oscillation-Based Test and Its Application to Analog Filters , 2010, IEEE Transactions on Circuits and Systems I: Regular Papers.

[23]  Karim Arabi,et al.  Parametric and catastrophic fault coverage of analog circuits in oscillation-test methodology , 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

[24]  Joan Figueras,et al.  Characterization of Floating Gate Defects in Analog Cells , 1999, J. Electron. Test..

[25]  Florence Azaïs,et al.  Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short , 2003, J. Electron. Test..

[26]  Viera Stopjakova,et al.  Oscillation-based Built-In Self Test of integrated active analog filters , 2011, 2011 International Conference on Applied Electronics.

[27]  Stefano Manetti,et al.  A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis , 2007, IEEE Transactions on Instrumentation and Measurement.

[28]  Diego Vázquez,et al.  A new strategy for testing analog filters , 1994, Proceedings of IEEE VLSI Test Symposium.

[29]  Viera Stopjakova,et al.  On-chip Parametric Test of R-2R Ladder Digital-to-Analog Converter and Its Efficiency , 2012 .

[30]  Hanjun Jiang,et al.  A fully digital-compatible BIST strategy for ADC linearity testing , 2007, 2007 IEEE International Test Conference.